Read IC can be diversify as three different ways like semi-invasive read IC, un-invasive read IC, invasive read IC. And ultra-violet radiation read IC is the most ancient way of this industry. Ultra-violet IC read method can be separated into two different ways: first is orientate the security fuse location second is read the IC with ultra-violet radiation.
In the process of locate the security fuse, there are several different ways, one of the most effective one when read IC is damaging the different part of IC and monitor the various results. Processing in this way will need long time and many samples before achieve the success of IC read. If the security fuse is very close to the memorizer when read the IC or the security fuse is integrated embedded. It would bring a lot of troubles when try to locate the IC security fuse and read it. At the same time, it could be the same by using ultra-violet radiation to remove the security fuse. The sequence of IC read test is very simple, half size of the IC will be covered by the unpenetrated material, and then expose the IC beneath the ultra-violet radiation line for a while for IC reading, once the protection has been removed, then the fuse will be on the uncovered part. Otherwise, exchanged cover and uncover area, and repeat the process for half size desizing will be great when read IC.
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